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analytical technique identifying surface composition by measuring ejected ions' flight time

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an analytical technique used to identify the composition of surfaces at a microscopic level. It works by bombarding a sample with a focused beam of ions, causing secondary ions to be ejected from the surface. These ejected ions are then measured based on their time of flight, which allows for the determination of their mass and, consequently, the identification of the elements and molecules present on the surface. This method is highly sensitive and can provide detailed chemical information about the outermost layers of a material.

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