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    Did you mean Time-of-Flight Secondary Ion Mass Spectrometry?
    Glossary Time-of-Flight Secondary Ion Mass Spectrometry

    analytical technique identifying surface composition by measuring ejected ions' flight time

    Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an analytical technique used to identify the composition of surfaces at a microscopic level. It works by bombarding a sample with a focused beam of ions, causing secondary ions to be ejected from the surface. These ejected ions are then measured based on their time of flight, which allows for the determination of their mass and, consequently, the identification of the elements and molecules present on the surface. This method is highly sensitive and can provide detailed chemical information about the outermost layers of a material.

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    1. Improved two‐dimensional electrophoretic mapping of Japanese human hair proteins; application to curved and straight Japanese human hairs; and protein identification by MALDI MS and MS/MS quadrupole time‐of‐flight mass spectrometry International Journal of Cosmetic Science · 2020
    2. Determination of 19 illegally added chemical ingredients in hair loss prevention cosmetics by ultra-performance liquid chromatography-quadrupole-time of flight mass spectrometry Sepu · 2022
    3. Mapping penetration of cosmetic compounds into hair fibers using time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) International Journal of Cosmetic Science · 2005 · 3 citations
    4. Study on the Efficacy and Potential Mechanism of Topical Shen Bai Hair Growing Decoction against Androgenetic Alopecia Based on Ultrahigh Performance Liquid Chromatography Quadrupole Time-of-Flight Mass Spectrometry and RNA-seq ACS Omega · 2024
    5. Biomimetics through bioconjugation of 16-methylheptadecanoic acid to damaged hair for hair barrier recovery Scientific Reports · 2024 · 4 citations
    6. Investigation of the damage on the outermost hair surface using ToF‐SIMS and XPS Surface and interface analysis · 2011 · 25 citations
    7. ToF‐SIMS characterization of the lipid layer on the hair surface. I: the damage caused by chemical treatments and UV radiation Surface and interface analysis · 2010 · 23 citations
    8. Analysis of keratin films as screening tools for predicting the efficacy of potential hair dyes Coloration Technology · 2019 · 7 citations
    9. Investigation of human hair using ToF-SIMS: From structural analysis to the identification of cosmetic residues Journal of vacuum science and technology. B, Nanotechnology & microelectronics · 2018 · 4 citations
    10. Penetration of cationic conditioning compounds into hair fibers: A TOF‐SIMS approach International Journal of Cosmetic Science · 2006 · 2 citations
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