Investigation of Human Hair Using ToF-SIMS: From Structural Analysis to the Identification of Cosmetic Residues
Studysummary This study demonstrated the potential of a methodology combining ToF-SIMS and AFM to effectively analyze human hair structure and identify cosmetic residues, which can aid the cosmetic industry in product development.
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The study explored the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for analyzing human hair, overcoming challenges posed by the hair's curvature and surface scales through delayed extraction and planar sectioning. The researchers successfully characterized the entire structure of human hair by longitudinally sectioning it and used atomic force microscopy (AFM) to assess surface variations due to cosmetic residues. They demonstrated that combining AFM with ToF-SIMS and principal component analysis could identify unknown cosmetic residues on hair, matching them to their original products. This method shows promise for investigating human hair and developing hair styling products within the cosmetic industry.
