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high-resolution imaging technique that maps surfaces at atomic scale

Atomic Force Microscopy (AFM) is a high-resolution imaging technique that allows scientists to visualize surfaces at the atomic level. It works by scanning a tiny, sharp probe over a sample's surface and measuring the forces between the probe and the sample to create detailed, three-dimensional images. This method is widely used in fields like materials science, biology, and nanotechnology to study the fine details of various materials, including hair and skin at the microscopic level.

Related Terms

• Electron Microscopy
• Scanning Probe Microscopy
• Scanning Tunneling Microscopy
• Scanning Electron Microscopy
• Transmission Electron Microscopy
• Flow Cytometry
• Multiphoton Microscopy
• Time-of-Flight Secondary Ion Mass Spectrometry