ToF-SIMS Characterization of the Lipid Layer on the Hair Surface: The Damage Caused by Chemical Treatments and UV Radiation
May 2010
in “
Surface and interface analysis
”
TLDR Chemical treatments and UV radiation severely damage the lipid layer on hair.
The study utilized Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to analyze the lipid layer on the hair surface, focusing on the damage caused by chemical treatments and UV radiation. The findings indicated that both chemical treatments and UV exposure significantly degraded the lipid layer, which is crucial for maintaining hair health and integrity. The research highlighted the importance of protecting hair from such damaging factors to preserve its natural lipid composition and overall condition.