Preparation and Characterization of Solution-Processed Nanocrystalline p-Type CuAlO2 Thin-Film Transistors
August 2018
in “
Nanoscale Research Letters
”
Studysummary This study reported that optimized nanocrystalline CuAlO2 thin-film transistors exhibited a threshold voltage of −1.3 V and may contribute to advancements in low-cost complementary metal oxide semiconductor logic circuits.
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